Title :
Designing ad-hoc codes for the realization of fault tolerant CMOS networks
Author :
Bolchini, C. ; Buonanno, G. ; Cozzini, M. ; Sciuto, D. ; Stefanelli, R.
Author_Institution :
Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
Abstract :
An evolution of the already introduced technique for synthesis of CMOS gate structures tolerating all single transistor stuck-on faults and a large set of multiple faults is presented. Such technique is aimed at guaranteeing fault tolerance for a multiple output gate through the application of an AUED separated encoding of the output functions and the introduction of additional transistors, to avoid fault propagation. The improvement consists in the generation of an ad-hoc AUED code tailored on the circuit being designed, so that the number of additional transistors can be reduced
Keywords :
CMOS logic circuits; combinational circuits; error detection codes; integrated circuit reliability; logic design; AUED code generation; CMOS gate structures; ad-hoc codes; fault tolerant CMOS networks; multiple faults; multiple output gate; single transistor stuck-on faults; Circuit faults; Costs; Electrical fault detection; Encoding; Fault tolerance; Network synthesis; Semiconductor device modeling; Switches; Switching circuits; Transistors;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-8186-8168-3
DOI :
10.1109/DFTVS.1997.628326