• DocumentCode
    3115550
  • Title

    Estimation of the statistical variation of crosstalk in wiring harnesses

  • Author

    Wu, Meilin ; Beetner, Daryl ; Hubing, Todd ; Ke, Haixin ; Sun, Shishuang

  • Author_Institution
    UMR/MS&T Electromagn. Compatibility Lab., Missouri Univ. of Sci. & Technol., Rolla, MO
  • fYear
    2008
  • fDate
    18-22 Aug. 2008
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Analyzing interference problems in vehicle wiring harnesses requires fast and accurate methods of approximating crosstalk. Worst-case approximations using lumped element models are fast and easy to use, but run the risk of overestimating problems. Statistical methods that account for the random variation of wire position help prevent overdesign, but are often difficult and time-consuming to apply and lack a clear link between problems and their cause. Here we investigate the use of simple lumped-element models to predict the statistical variation of crosstalk in wire harness bundles. Models are based on lumped-element approximations, where inductance and capacitance values are calculated for a single bundle cross-section, and only the circuit position is varied. Accuracy was evaluated by comparing results to numerical simulations. The method does a good job of quickly predicting the reasonable worst-case values of crosstalk due to inductive or capacitive coupling.
  • Keywords
    approximation theory; automotive electronics; crosstalk; electromagnetic compatibility; electromagnetic wave interference; random processes; statistical analysis; crosstalk statistical variation estimation; electromagnetic compatibility; interference problem; lumped element model; random variation; single bundle cross-section; vehicle wiring harness; wire position; worst-case crosstalk approximation; Capacitance; Circuits; Crosstalk; Inductance; Interference; Predictive models; Statistical analysis; Vehicles; Wire; Wiring; Approximation methods; crosstalk; harness; modeling; statistics; vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
  • Conference_Location
    Detroit, MI
  • Print_ISBN
    978-1-4244-1699-8
  • Electronic_ISBN
    978-1-4244-1698-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2008.4652132
  • Filename
    4652132