DocumentCode
3115645
Title
Orthogonal loops probe design and characterization for near-field measurement
Author
Li, Tun ; Ho, Yong Cheh ; Pommerenke, David
Author_Institution
EMCLAB, Missouri Univ. of Sci. & Technol., Rolla, MO
fYear
2008
fDate
18-22 Aug. 2008
Firstpage
1
Lastpage
4
Abstract
Near-field probes are often used to measure the electric and magnetic fields above a printed circuit board in order to identify the sources and coupling paths of an electromagnetic interference (EMI) problem. It is the objective of this paper to propose a rapid E-, Hx- Hy- and circular H-fields measurement using an orthogonal loops probe design. The effects of this probe are analyzed using full-wave simulations and measurements.
Keywords
electric field measurement; electromagnetic interference; magnetic field measurement; probes; EMI; electromagnetic interference; near-field measurement; orthogonal loops probe design; printed circuit board; Analytical models; Circuit simulation; Coupling circuits; Electric variables measurement; Electromagnetic coupling; Electromagnetic interference; Electromagnetic measurements; Magnetic field measurement; Printed circuits; Probes; Orthogonal loops; phase shifting;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location
Detroit, MI
Print_ISBN
978-1-4244-1699-8
Electronic_ISBN
978-1-4244-1698-1
Type
conf
DOI
10.1109/ISEMC.2008.4652138
Filename
4652138
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