DocumentCode :
3115720
Title :
Time synchronized near-field and far-field for EMI source identification
Author :
Feng, Gang ; Wu, Wei ; Pommerenke, David ; Fan, Jun ; Beetner, Daryl G.
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO
fYear :
2008
fDate :
18-22 Aug. 2008
Firstpage :
1
Lastpage :
5
Abstract :
The evaluation of a product in terms of radiated emissions involves identifying the noise sources. Spectrum analyzer (SA) measurements alone are unable to identify noise sources when multiple sources are responsible for emissions at a particular frequency. In this paper, an approach using combined near-field and far-field measurements is proposed. This method consists of recording signals from a near field probe and from an antenna in the far-field using a high speed oscilloscope and analyzing the relationship between them via different post processing methods. The noise source can be identified by varying the location of near-field probe and searching for the probe signal that best correlates to the far field signal. A variety of post processing methods have been employed in this work. The short term fast Fourier transform (STFFT) is used to visualize the time dependence of the frequency content. Envelope correlation, coherence factor, and cross-correlation methods are further explained and tested for their ability to identify possible sources of emission problems.
Keywords :
antennas; electromagnetic interference; fast Fourier transforms; noise; oscilloscopes; EMI source identification; coherence factor; cross-correlation methods; electromagnetic interference; envelope correlation; high speed oscilloscope; noise sources; radiated emissions; short term fast Fourier transform; spectrum analyzer measurements; time synchronized near field-far field; Antenna measurements; Electromagnetic interference; Frequency measurement; Frequency synchronization; Noise measurement; Oscilloscopes; Particle measurements; Probes; Signal processing; Spectral analysis; EMI; STFFT; coherence; cross-correlation; far field and near field; source identification;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
Type :
conf
DOI :
10.1109/ISEMC.2008.4652142
Filename :
4652142
Link To Document :
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