Title : 
Integration of differences in EEG Analysis Reveals Changes in Human EEG Caused by Microwave
         
        
            Author : 
Bachmann, Maie ; Lass, Jaanus ; Kalda, Jaan ; Sakki, Maksim ; Tomson, Ruth ; Tuulik, Viiu ; Hinrikus, Hiie
         
        
            Author_Institution : 
Biomed. Eng. Center, Tallinn Univ. of Technol.
         
        
        
            fDate : 
Aug. 30 2006-Sept. 3 2006
         
        
        
        
            Abstract : 
Three different methods in combination with integration of differences in signals were applied for EEG analysis to distinguish changes in EEG caused by microwave: S-parameter, power spectral density and length distribution of low variability periods. The experiments on the effect of modulated low-level microwaves on human EEG were carried out on four different groups of healthy volunteers exposed to 450 MHz microwave radiation modulated with 7 Hz, 14 Hz, 21 Hz, 40 Hz, 70 Hz, 217 or 1000 Hz frequencies. The field power density at the scalp was 0.16 mW/cm2. The EEG analysis performed for individuals with three different methods showed that statistically significant changes occur in the EEG rhythms energy and dynamics between 12% and 30% of subjects
         
        
            Keywords : 
S-parameters; electroencephalography; microwaves; modulation; statistical analysis; 1000 Hz; 14 Hz; 21 Hz; 217 Hz; 40 Hz; 450 MHz; 7 Hz; 70 Hz; EEG dynamics; EEG rhythms energy; S-parameter; human electroencephalography analysis; low-level microwave effects; microwave radiation modulation; power spectral density; statistical analysis; variability period; Aging; Cities and towns; Electroencephalography; Frequency modulation; Humans; Microwave theory and techniques; Nervous system; Radiation detectors; Rhythm; Signal analysis; EEG rhythm; EMF effects; low-level radiation; modulation; nonlinear analysis;
         
        
        
        
            Conference_Titel : 
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
         
        
            Conference_Location : 
New York, NY
         
        
        
            Print_ISBN : 
1-4244-0032-5
         
        
            Electronic_ISBN : 
1557-170X
         
        
        
            DOI : 
10.1109/IEMBS.2006.259234