Title :
Harvesting through array partitioning: a solution to achieve defect tolerance
Author :
Distante, F. ; Sami, M.G. ; Stefanelli, R.
Author_Institution :
Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
Abstract :
The problem of “harvesting” aims at obtaining the largest possible working array from an original array in which a (possibly high) number of faults are present, typically at the end of production. While complete spares efficiency has been proved to require channel width and interconnection length proportional to the dimensions of the array, techniques previously presented in literature achieved fixed-dimensions for channels and links by accepting low spares efficiency. In the present paper an approach previously adopted for survival to faults (i.e., to achieve arrays of fixed dimensions with a pre-determined distribution of spares) is extended to the harvesting problem by proving that partitioning the original array into subarrays (within a limited set of constraints) lends to effective reconfiguration. Spares efficiency is seen to be quite satisfactory
Keywords :
VLSI; fault tolerant computing; integrated circuit reliability; microprocessor chips; parallel architectures; reconfigurable architectures; redundancy; VLSI arrays; array partitioning; defect tolerance; harvesting problem; high fault number; processor arrays; reconfiguration; spares efficiency; subarrays; Costs; Fault tolerance; Length measurement; Multiprocessor interconnection networks; Production; Runtime; Switches;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-8186-8168-3
DOI :
10.1109/DFTVS.1997.628333