Title :
An approach for detecting bridging faults in CMOS domino logic circuits using dynamic power supply current monitoring
Author :
Walker, Alvemon ; Henry, Algemon P. ; Lala, Parag K.
Author_Institution :
Dept. of Electr. Eng., North Carolina A&T State Univ., Greensboro, NC, USA
Abstract :
A new approach for the detection of bridging faults in CMOS domino logic circuits is presented in this paper. It is based upon the transient current that is sourced (or sink) by the power supply (or ground) rail of the inverter in the domino logic gate during a low-to-high (or high-to-low) output transition. We show that the dynamic power supply current can be used to detect bridging faults because it is a function of the parameters and the interconnectivity of the transistors that form the discharge/charge circuits in the gate-under-test. An example of a dynamic power supply current monitoring circuit is also presented. This paper is concluded with an example of the application of the proposed approach for detecting bridging faults in CMOS domino logic circuit
Keywords :
CMOS logic circuits; electric current measurement; fault location; integrated circuit testing; logic testing; monitoring; CMOS domino logic circuits; bridging faults detection; dynamic power supply current monitoring; transient current; CMOS logic circuits; Circuit faults; Current supplies; Electrical fault detection; Fault detection; Inverters; Logic circuits; Logic gates; Power supplies; Rails;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-8186-8168-3
DOI :
10.1109/DFTVS.1997.628334
