Title :
Why We Need Design-for-testability
Author_Institution :
Stanford Center for Reliable Computing
Abstract :
Summary form only given. The basic reason for testing integrated circuits is to ensure satisfactory operation of a customer´s system. Some systems require continuous uninterrupted operation.
Keywords :
Books; Circuit testing; Conferences; Design for testability; Electronic equipment testing; Integrated circuit reliability; Integrated circuit testing; Logic testing; System testing; Telephony;
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
DOI :
10.1109/ISSCC.1991.689049
