DocumentCode :
3115798
Title :
Why We Need Design-for-testability
Author :
McCluskey, E.J.
Author_Institution :
Stanford Center for Reliable Computing
fYear :
1991
fDate :
13-15 Feb. 1991
Firstpage :
26
Lastpage :
26
Abstract :
Summary form only given. The basic reason for testing integrated circuits is to ensure satisfactory operation of a customer´s system. Some systems require continuous uninterrupted operation.
Keywords :
Books; Circuit testing; Conferences; Design for testability; Electronic equipment testing; Integrated circuit reliability; Integrated circuit testing; Logic testing; System testing; Telephony;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
Type :
conf
DOI :
10.1109/ISSCC.1991.689049
Filename :
689049
Link To Document :
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