Title :
On-line error detection for finite field multipliers
Author :
Gossel, Michael ; Fenn, Sebastian ; Taylor, Dave
Author_Institution :
Potsdam Univ., Germany
Abstract :
In this paper error-detection is applied to finite field multipliers. It is shown that by using parity prediction, error-detection can be incorporated into these multipliers with very low hardware overheads. The structures of error-detection circuits for any finite field are given for these multipliers. The hardware overheads of these methods are independent of m and so for large values of m the presented approaches are particularly hardware efficient. The fault coverage of these structures are investigated by simulation experiments
Keywords :
Galois fields; error detection; multiplying circuits; parity; fault coverage; finite field multiplier; hardware overhead; on-line error detection circuit; parity prediction; simulation; Arithmetic; Circuit faults; Circuit simulation; Cryptography; Error correction codes; Fault detection; Galois fields; Hardware; Polynomials; Reed-Solomon codes;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-8186-8168-3
DOI :
10.1109/DFTVS.1997.628338