DocumentCode :
3115907
Title :
Implantation effects of ultra-thin Fe/Cr multilayers
Author :
Sakamoto, I. ; Tanoue, H. ; Koike, M. ; Hnda, S. ; Nawate, M. ; Shimizu, T.
Author_Institution :
Electrotech. Lab., Ibaraki, Japan
fYear :
2000
fDate :
2000
Firstpage :
789
Lastpage :
792
Abstract :
The magnetic and structural properties of ultra-thin Fe/Cr multilayers (MLs) after ion implantation by 150 keV Cr and Fe ions have been investigated using a vibrating sample magnetometer (VSM) and a conversion electron Mossbauer spectroscopy (CEMS) to clarify a relation among the magnetization, giant magnetoresistance (GMR) properties and the interface structure. We have shown that the ion implantation induces the degradation of the interface structure resulting in a break of antiferromagnetic coupling and a decrease of magnetization, which correspond to the change of GMR properties
Keywords :
Mossbauer effect; chromium; conversion electron spectra; giant magnetoresistance; interface structure; ion implantation; iron; magnetic multilayers; magnetisation; 150 keV; Fe-Cr; antiferromagnetic coupling; conversion electron Mossbauer spectroscopy; giant magnetoresistance; interface structure; ion implantation; magnetization; ultrathin multilayers; vibrating sample magnetometry; Chromium; Giant magnetoresistance; Ion implantation; Iron; Magnetic multilayers; Magnetic properties; Magnetization; Magnetometers; Multilevel systems; Nonhomogeneous media;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ion Implantation Technology, 2000. Conference on
Conference_Location :
Alpbach
Print_ISBN :
0-7803-6462-7
Type :
conf
DOI :
10.1109/.2000.924272
Filename :
924272
Link To Document :
بازگشت