Title :
Duty-cycle distortion and specifications for jitter test-signal generation
Author :
Marcu, Mihai ; Durbha, Sriram ; Gupta, Sanjeev
Author_Institution :
EEsof-EDA, Agilent Technol. Inc., Santa Rosa, CA
Abstract :
Duty-cycle distortion is one of the causes of deterministic jitter. Clarification and refinement of this jitter type is presented here. The jitter-tree is then updated with the jitter types discussed. Predicting the behavior of electrical systems under stress from jitter through simulations is limited by the availability of signal sources with controllable and flexible jitter properties in the design environment. A jitter specification method for ISI and DCD is recommended.
Keywords :
distortion; signal generators; timing jitter; trees (mathematics); ISI; duty-cycle distortion; electrical system behavior; jitter specification method; jitter test-signal generation; jitter-tree; Character generation; Clocks; Distortion; Frequency; Intersymbol interference; Jitter; Performance evaluation; Signal generators; Software measurement; Testing; DCD; duty-cycle distortion; jitter; jitter components; jitter generation; jitter test;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652150
