DocumentCode
3115947
Title
On the VLSI implementation of the international data encryption algorithm IDEA
Author
Wolter, Stefan ; Matz, Holger ; Schubert, Andreas ; Laur, Rainer
Author_Institution
Res. & Dev., German Telecom, Darmstadt, Germany
Volume
1
fYear
1995
fDate
30 Apr-3 May 1995
Firstpage
397
Abstract
This paper describes a new VLSI realization of the International Data Encryption Algorithm IDEA. The presented VLSI architecture is compared with the VINCI chip, the first silicon realization of the IDEA. Principal design aspects are also discussed. Although the VINCI circuit can be used for real-time encryption in high-speed networks such as ATM, there are requirements for VLSI circuits with faster encryption ability. Further, the implemented test during the normal operation in the VINCI chip cannot detect all possible errors. The proposed new implementation is motivated by the requirement for higher data rates and a new solution for the on-line test problem, which is a main task in implementing cryptographic algorithms. First design results show that the resulting circuit can achieve an encryption rate of about 355 Mb/s. This is achieved by the implementation of one round in a 0.8 μm CMOS technology. The architecture includes a concurrent self-test based on a mod-3 residue code self-checking system which allows the detection of permanent and temporary single- and multiple-bit errors in the IDEA datapath and hence the secure prevention of faulty encrypted or decrypted data
Keywords
CMOS digital integrated circuits; VLSI; automatic testing; built-in self test; cryptography; digital signal processing chips; error detection; integrated circuit testing; 0.8 micron; 355 Mbit/s; CMOS technology; DSP chip; IDEA; VLSI architecture; VLSI implementation; concurrent self-test; international data encryption algorithm; mod-3 residue code self-checking system; online testing; Built-in self-test; CMOS technology; Circuit faults; Circuit testing; Cryptography; Electrical fault detection; Fault detection; High-speed networks; Silicon; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
0-7803-2570-2
Type
conf
DOI
10.1109/ISCAS.1995.521534
Filename
521534
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