• DocumentCode
    3115947
  • Title

    On the VLSI implementation of the international data encryption algorithm IDEA

  • Author

    Wolter, Stefan ; Matz, Holger ; Schubert, Andreas ; Laur, Rainer

  • Author_Institution
    Res. & Dev., German Telecom, Darmstadt, Germany
  • Volume
    1
  • fYear
    1995
  • fDate
    30 Apr-3 May 1995
  • Firstpage
    397
  • Abstract
    This paper describes a new VLSI realization of the International Data Encryption Algorithm IDEA. The presented VLSI architecture is compared with the VINCI chip, the first silicon realization of the IDEA. Principal design aspects are also discussed. Although the VINCI circuit can be used for real-time encryption in high-speed networks such as ATM, there are requirements for VLSI circuits with faster encryption ability. Further, the implemented test during the normal operation in the VINCI chip cannot detect all possible errors. The proposed new implementation is motivated by the requirement for higher data rates and a new solution for the on-line test problem, which is a main task in implementing cryptographic algorithms. First design results show that the resulting circuit can achieve an encryption rate of about 355 Mb/s. This is achieved by the implementation of one round in a 0.8 μm CMOS technology. The architecture includes a concurrent self-test based on a mod-3 residue code self-checking system which allows the detection of permanent and temporary single- and multiple-bit errors in the IDEA datapath and hence the secure prevention of faulty encrypted or decrypted data
  • Keywords
    CMOS digital integrated circuits; VLSI; automatic testing; built-in self test; cryptography; digital signal processing chips; error detection; integrated circuit testing; 0.8 micron; 355 Mbit/s; CMOS technology; DSP chip; IDEA; VLSI architecture; VLSI implementation; concurrent self-test; international data encryption algorithm; mod-3 residue code self-checking system; online testing; Built-in self-test; CMOS technology; Circuit faults; Circuit testing; Cryptography; Electrical fault detection; Fault detection; High-speed networks; Silicon; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1995. ISCAS '95., 1995 IEEE International Symposium on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    0-7803-2570-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.1995.521534
  • Filename
    521534