Title :
Processing waveguide photonic components into self-assembled organic films
Author :
Canning, J. ; Gibson, B. ; Huyang, G. ; Khoury, T. ; Sum, T.J. ; Neto, C. ; Crossley, M.J.
Author_Institution :
Interdiscipl. Photonics Labs., Univ. of Sydney, Sydney, NSW, Australia
Abstract :
A focused ion beam (FIB) is used to process 2-D self-assembled photonic porphyrin film flats to fabricate couplers in 2-D porphyrin slabs. These self-assembled structures have an initial root mean squared (rms) values for surface roughness < 0.5 nm as measured by atomic force microscopy. Under appropriate FIB processing and cutting conditions, the rms value for surface roughness falls to < 0.4 nm.
Keywords :
focused ion beam technology; optical fabrication; optical planar waveguides; organic compounds; photonic band gap; self-assembly; 2D self assembled photonic porphyrin film; focused ion beam; self assembled organic films; surface roughness; waveguide photonic component processing; Atomic force microscopy; Atomic measurements; Force measurement; Milling; Optical films; Optical waveguides; Rough surfaces; Slabs; Surface roughness; Waveguide components;
Conference_Titel :
OptoElectronics and Communications Conference, 2009. OECC 2009. 14th
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4102-0
Electronic_ISBN :
978-1-4244-4103-7
DOI :
10.1109/OECC.2009.5215355
