Author index

fYear

1997

fDate

20-22 Oct. 1997

Firstpage

313

Lastpage

314

Abstract

The author index contains an entry for each author and coauthor included in the proceedings record.

fLanguage

English

Publisher

ieee

Conference_Titel

Defect and Fault Tolerance in VLSI Systems, 1997. Proceedings., 1997 IEEE International Symposium on

Conference_Location

Paris, France

ISSN

1550-5774

Print_ISBN

0-8186-8168-3

Type

conf

DOI

10.1109/DFTVS.1997.628339

Filename

628339

Link To Document