DocumentCode :
3116131
Title :
Thermo-mechanical simulations and measurements on high temperature interconnections
Author :
Brinkfeldt, Klas ; Amen, Rafael ; Adolfsson, Erik ; Tegehall, Per-Erik ; Johander, Per ; Andersson, Oag
Author_Institution :
Swerea IVF AB, Mölndal, Sweden
fYear :
2011
fDate :
18-20 April 2011
Firstpage :
42376
Lastpage :
42558
Abstract :
In order to place sensors or electronics in very high temperature environments, new materials and methods for interconnection are required. A comparative study between different electrical interconnection methods for very high operation temperatures (500°C - 800°C) is presented. Thermo-mechanical simulations and characterization of samples of the interconnection types during high temperature exposure are presented. The results of the thermo-mechanical simulations showed that stresses are low in a connection system based on liquid interconnection. This system, however, proved to be difficult to realize due to problems with oxides and sealing of the metallic liquid. Modeling of an interconnection based purely on mechanical pressure without any solder or metallic bond showed high stress. This was also confirmed during high temperature exposure where the connection failed. High stress was also predicted for an interconnection based on nano-Ag paste. The high temperature tests, however, showed promising results at 800°C for over 100 hours.
Keywords :
electrical contacts; integrated circuit interconnections; integrated circuit metallisation; mechanical properties; silver; thermal analysis; thermal management (packaging); Ag; electrical interconnection method; high temperature interconnection; mechanical pressure; metallic liquid sealing; nanosilver paste; temperature 500 C to 800 C; thermo-mechanical simulations; Atmospheric modeling; Integrated circuit interconnections; Integrated circuit modeling; Nitrogen; Silicon; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on
Conference_Location :
Linz
Print_ISBN :
978-1-4577-0107-8
Type :
conf
DOI :
10.1109/ESIME.2011.5765772
Filename :
5765772
Link To Document :
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