• DocumentCode
    3116131
  • Title

    Thermo-mechanical simulations and measurements on high temperature interconnections

  • Author

    Brinkfeldt, Klas ; Amen, Rafael ; Adolfsson, Erik ; Tegehall, Per-Erik ; Johander, Per ; Andersson, Oag

  • Author_Institution
    Swerea IVF AB, Mölndal, Sweden
  • fYear
    2011
  • fDate
    18-20 April 2011
  • Firstpage
    42376
  • Lastpage
    42558
  • Abstract
    In order to place sensors or electronics in very high temperature environments, new materials and methods for interconnection are required. A comparative study between different electrical interconnection methods for very high operation temperatures (500°C - 800°C) is presented. Thermo-mechanical simulations and characterization of samples of the interconnection types during high temperature exposure are presented. The results of the thermo-mechanical simulations showed that stresses are low in a connection system based on liquid interconnection. This system, however, proved to be difficult to realize due to problems with oxides and sealing of the metallic liquid. Modeling of an interconnection based purely on mechanical pressure without any solder or metallic bond showed high stress. This was also confirmed during high temperature exposure where the connection failed. High stress was also predicted for an interconnection based on nano-Ag paste. The high temperature tests, however, showed promising results at 800°C for over 100 hours.
  • Keywords
    electrical contacts; integrated circuit interconnections; integrated circuit metallisation; mechanical properties; silver; thermal analysis; thermal management (packaging); Ag; electrical interconnection method; high temperature interconnection; mechanical pressure; metallic liquid sealing; nanosilver paste; temperature 500 C to 800 C; thermo-mechanical simulations; Atmospheric modeling; Integrated circuit interconnections; Integrated circuit modeling; Nitrogen; Silicon; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on
  • Conference_Location
    Linz
  • Print_ISBN
    978-1-4577-0107-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2011.5765772
  • Filename
    5765772