DocumentCode :
3116158
Title :
Noise coupling between power/ground nets due to differential vias transitions in a multilayer PCB
Author :
Cocchini, Matteo ; Fan, Jun ; Archambeault, Bruce ; Knighten, James L. ; Chang, Xin ; Drewniak, James L. ; Zhang, Yaojiang ; Connor, Samuel
Author_Institution :
UMR/MST EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO
fYear :
2008
fDate :
18-22 Aug. 2008
Firstpage :
1
Lastpage :
6
Abstract :
Due to the increase in board density, routing traces on different layers becomes a widely used strategy. Through-hole vias are often used to connect these traces. Those vias that penetrate power/ground plane pairs could cause noise coupling between signal and power/ground nets. At the same time, the need for clean signal transmitted to receivers results in a wide use of differential signals. This paper studies the noise coupling mechanism caused by a differential pair of vias penetrating power/ground plane pair using a physics-based via-plane model combined with transmission line models for traces. A 26-layer printed circuit board with a pair of differential vias have been modeled. The simulated results clearly demonstrate the impact of ground vias and via stubs on noise coupling.
Keywords :
electromagnetic coupling; network routing; printed circuits; transmission lines; differential vias transition; ground nets; multilayer PCB; noise coupling; physics-based via-plane model; power nets; printed circuit board; routing trace; transmission line model; Capacitors; Circuit noise; Coupling circuits; Geometry; Microstrip; Noise generators; Nonhomogeneous media; Power transmission lines; Printed circuits; Stripline; Differential signal; cavity model; ground vias; noise coupling between signal and power/ground nets; signal via transition; via capacitance; via stub;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
Type :
conf
DOI :
10.1109/ISEMC.2008.4652163
Filename :
4652163
Link To Document :
بازگشت