Title :
An analysis of feedback bridging faults in MOS VLSI
Author_Institution :
Dept. of Comput. Eng. & Sci., Case Western Reserve Univ., Cleveland, OH, USA
Abstract :
The feedback bridging faults are examined in detail for MOS digital circuits. A necessary condition is obtained which needs to be satisfied for oscillations in the circuit. Expression are given to predict the frequency and amplitude of oscillations. It is shown that when a feedback bridging fault does not cause oscillations, it creates an anomalous output. Such faults may not be detected by logic testing: the authors recommend measurement of power supply current to detect such faults in CMOS circuit.<>
Keywords :
CMOS integrated circuits; VLSI; circuit oscillations; digital integrated circuits; fault location; integrated circuit testing; CMOS; MOS VLSI; amplitude; anomalous output; digital circuits; feedback bridging faults; frequency; oscillations; power supply current; Circuit faults; Current measurement; Digital circuits; Electrical fault detection; Fault detection; Frequency; Logic testing; Output feedback; Power measurement; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location :
Atlantic City, NJ, USA
DOI :
10.1109/VTEST.1991.208132
