Title :
A moment method analysis of an aperture coupled rectangular dielectric resonator antenna
Author :
Yau, D. ; Shuley, N.V.
Author_Institution :
Dept. of Comput. Sci. & Electr. Eng., Queensland Univ., Brisbane, Qld., Australia
Abstract :
An efficient but rigorous model based on the surface integral equation (SIE) approach is proposed for the analysis of the antenna. The dielectric resonator (DR) is modeled in terms of equivalent surface electric and magnetic currents using combined field integral equations (CFIE) formulation. The CFIE, the microstrip feedline and the associated coupling mechanism are formulated as a set of coupled equations in the spatial domain in the form of the mixed potential integral equations (MPIE). The coupled integral equations are solved by use of the method of moments (MoM) using Galerkin´s procedure. In the microstrip region, closed-form Green´s functions are employed in the calculation to enhance the numerical efficiency. It is demonstrated that the proposed model is very economical in usage of computer resources for generating accurate results for the input impedance.
Keywords :
Galerkin method; Green´s function methods; antenna feeds; dielectric resonators; electric impedance; electric potential; electromagnetic coupling; integral equations; method of moments; microstrip antennas; microstrip lines; CFIE; Galerkin´s procedure; MPIE; MoM; aperture coupled rectangular dielectric resonator antenna; closed-form Green´s functions; combined field integral equations; coupled integral equations; coupling mechanism; input impedance; microstrip feedline; microstrip region; mixed potential integral equations; moment method analysis; numerical efficiency; rigorous model; spatial domain; surface electric current; surface integral equation; surface magnetic current; Aperture antennas; Aperture coupled antennas; Bandwidth; Couplings; Dielectric resonator antennas; Integral equations; Magnetic separation; Microstrip; Moment methods; Surface treatment;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1999. IEEE
Conference_Location :
Orlando, FL, USA
Print_ISBN :
0-7803-5639-x
DOI :
10.1109/APS.1999.789448