DocumentCode :
3116379
Title :
Electro-thermal parameter extraction of avalanche photodiode using quasi-DC optical pulses [pulsed laser radar applications]
Author :
Ghose, A. ; Weide, J. ; Kompa, G.
Author_Institution :
Dept. of High Frequency Eng., Kassel Univ., Germany
fYear :
2002
fDate :
18-19 Nov. 2002
Firstpage :
69
Lastpage :
74
Abstract :
For pulsed laser radar applications, the accuracy of measured distance depends largely on the rise time of received pulses. Due to nonlinearity of the avalanche photodiode in its breakdown region, the rise time of avalanche response changes with incident peak optical pulses. An accurate model of the avalanche photodiode is needed to predict correctly the time of arrival of incident pulses. In this work, we describe one experiment-based method of characterization of avalanche photodiodes to predict electrothermal parameters when used with pulsed laser radar. We applied pulsed optical power of 5 μs duration, 5% duty cycle, and measurement was carried out during the ´on´ period so that reliable measurement is possible without affecting the device thermal time constants.
Keywords :
avalanche photodiodes; electronic engineering computing; equivalent circuits; optical radar; optical testing; semiconductor device breakdown; semiconductor device measurement; semiconductor device models; thermal analysis; 5 mus; avalanche photodiode electro-thermal parameter extraction; avalanche response rise time; device thermal time constants; equivalent circuit models; incident peak optical pulses; incident pulse arrival time prediction; photodiode breakdown region nonlinearity; pulsed laser radar measured distance accuracy; pulsed optical power duration/duty cycle; quasi-DC optical pulses; received pulse rise time; Avalanche photodiodes; Laser applications; Laser modes; Laser radar; Optical pulses; Parameter extraction; Power measurement; Pulse measurements; Radar applications; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices for Microwave and Optoelectronic Applications, 2002. EDMO 2002. The 10th IEEE International Symposium on
Print_ISBN :
0-7803-7530-0
Type :
conf
DOI :
10.1109/EDMO.2002.1174932
Filename :
1174932
Link To Document :
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