Title :
VLSI procurement and qualification: NASA/GSFC experience, issues and concerns
Author :
Sharma, Ashok K.
Author_Institution :
NASA, Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
Describes the VLSI parts quality and reliability issued for NASA space flight use, particularly from a NASA/Goddard Space Flight Center (GSFC) perspective. A case history of four chip set gate arrays planned for use on a high speed flight data recorder, qualification effort based on MIL-M-38510 requirements, is discussed.<>
Keywords :
VLSI; aerospace instrumentation; application specific integrated circuits; circuit reliability; logic arrays; quality control; Goddard Space Flight Center; MIL-M-38510; NASA space flight use; VLSI; chip set gate arrays; flight data recorder; parts quality; reliability; CMOS logic circuits; Microprocessors; Monitoring; NASA; Process control; Procurement; Qualifications; Space exploration; Testing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location :
Atlantic City, NJ, USA
DOI :
10.1109/VTEST.1991.208143
