DocumentCode :
3116545
Title :
Optimization of solder joint configuration in multi-chip packaging system
Author :
Hornales, Benjie Balos
Author_Institution :
Fairchild Semicond., Lapu-Lapu City, Philippines
fYear :
2011
fDate :
18-20 April 2011
Firstpage :
42373
Lastpage :
42464
Abstract :
Packaging engineers, in the search for the perfect packaging technology, are turning to three-dimensional packaging technologies that stack multiple dies/chips within a single package. Prevailing problems with stacked dies and clips are the tilting of the chips or clips due to the unbalanced bond line thickness of different solder attachments at different height levels or unbalanced weight distribution of the components inside the package. This could be a result of offset pads or inaccurate solder volume which results to uneven BLTs or solder joints, which all boils down to not having adequate modeling tools at hand to foresee potential tilting issues in a complicated solder joint system constrained in one package. This paper addresses this issue by utilizing an FEA modeling tool that can model the solder joint system of any stacked or clip packages. The tilting of the die is successfully modeled and the BLT predicted correlates well within the actual result. The mechanism of chip tilting was investigated and correlated with actual cross-section result. The availability of the modeling tool to successfully model multi-body solder joint system is a breakthrough in package tilting modeling efforts. Optimization of the solder joint system of any package is now possible with the Tool.
Keywords :
chip scale packaging; finite element analysis; multichip modules; solders; 3D packaging technology; FEA modeling tool; multi-body solder joint system; multi-chip packaging system; package tilting modeling; solder joint configuration; stacked dies; unbalanced bond line thickness; weight distribution; Correlation; Gravity; Joints; Nickel; Optimization; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on
Conference_Location :
Linz
Print_ISBN :
978-1-4577-0107-8
Type :
conf
DOI :
10.1109/ESIME.2011.5765796
Filename :
5765796
Link To Document :
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