Guardbanding VLSI EEPROM test programs

Author

Sweetman, D.

fYear

1991

fDate

15-17 April 1991

Firstpage

155

Lastpage

160

Abstract

The test and guardband philosophy is essential in the manufacturing of integrated circuits. The philosophy integrates the general rules for test sequences, hardware, and software. The data sheet and philosophy determine the values and methodology for parameter and functional tests. Guardbanding is the off-setting of a test parameter, condition, or attribute acceptance level from the specified value. Variability in equipment and device performance necessitate machine guardbands. Device and test program guardbands improve test productivity. Changing the applied, measured, or external conditions from those specified implements the guardbands for attribute testing. The author addresses the use of guardbands for an MOS VLSI EEPROM, i.e. a nonvolatile reprogrammable memory.<>

Keywords

EPROM; MOS integrated circuits; integrated circuit testing; integrated memory circuits; production testing; MOS; VLSI EEPROM; integrated circuits; manufacturing; nonvolatile reprogrammable memory; test parameter offsetting; test productivity; test program guardbands; test sequences; Assembly; Automatic testing; Circuit testing; Costs; EPROM; Integrated circuit technology; Manufacturing; Performance evaluation; Production; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers

Conference_Location

Atlantic City, NJ, USA

Type

conf

DOI

10.1109/VTEST.1991.208151

Filename

208151