Title :
Using component-level measurements to determine system-level radiated emissions
Author_Institution :
Vehicular Electron., Clemson Univ., Clemson, SC
Abstract :
In this presentation, new EMC test procedures employing hybrid TEM cells, high-impedance voltage and low-impedance current measurements, and true radiated emissions measurements will quantify the important parameters of interest providing component-level information that can be used to predict system-level performance.
Keywords :
TEM cells; electromagnetic compatibility; immunity testing; EMC test; component-level measurements; hybrid TEM cells; impedance; system-level radiated emissions; Coupling circuits; Electromagnetic compatibility; Electromagnetic coupling; Electromagnetic fields; Electromagnetic measurements; Electromagnetic radiation; IEC standards; Integrated circuit measurements; Magnetic field measurement; Mutual coupling;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652191
