Title :
New phonon in cadmium zinc telluride
Author :
Chack, A. ; Beserman, R. ; Stolyarova, S. ; Nemirovsky, Y. ; Weil, R.
Author_Institution :
Solid State Inst., Technion-Israel Inst. of Technol., Haifa, Israel
Abstract :
The discovery of an unreported phonon in Cd1-xZnx Te is presented. This phonon is only present in thin films, and only when 0<x<1. The phonon is seen at 195 cm-1 and the Raman line is a resonant at an excitation in the vicinity if 600 nm. We believe this phonon is caused by microcrystalline clusters of ZnTe embedded in the Cd1-xZnxTe film, however, this assignation is not final, as further experiments are needed to rule out other possibilities such as a phonon from the ordered phase
Keywords :
II-VI semiconductors; Raman spectra; cadmium compounds; phonons; semiconductor thin films; zinc compounds; CdZnTe; Raman line; microcrystalline clusters; phonon; thin films; Cadmium compounds; Conductivity; Frequency; Infrared detectors; Phonons; Substrates; Temperature; Transistors; X-ray detectors; Zinc compounds;
Conference_Titel :
Electrical and electronic engineers in israel, 2000. the 21st ieee convention of the
Conference_Location :
Tel-Aviv
Print_ISBN :
0-7803-5842-2
DOI :
10.1109/EEEI.2000.924318
