Title :
Distributed self-diagnosis of VLSI mesh array processors
Author :
Cutler, Michal ; Su, Stephen Y H ; Wang, Minghsien
Author_Institution :
Dept. of Comput. Sci., State Univ. of New York, Binghamton, NY, USA
Abstract :
A distributed self-diagnosis algorithm for VLSI mesh arrays with small clusters of faults is presented. It allows only fault-free cells to make decisions and to propagate diagnosis results. Its time complexity is constant with respect to the number of processors. The diagnosability is proportional to the array size.<>
Keywords :
VLSI; automatic testing; built-in self test; cellular arrays; computer testing; fault location; fault tolerant computing; integrated circuit testing; microprocessor chips; parallel architectures; VLSI mesh array processors; diagnosability; distributed self-diagnosis algorithm; fault-free cells; Automatic testing; Clustering algorithms; Computer science; Design automation; Distributed computing; Fault diagnosis; Signal processing; System testing; Test pattern generators; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location :
Atlantic City, NJ, USA
DOI :
10.1109/VTEST.1991.208155
