Automated diagnosis of VLSI failures

Author

Ryan, Paul G. ; Rawa, Shishpal ; Fuchs, Kent W.

Author_Institution

Intel Corp., Folsom, CA, USA

fYear

1991

fDate

15-17 April 1991

Firstpage

187

Lastpage

192

Abstract

Fault dictionaries are examined as a tool for automated diagnosis of VLSI failures. A compressed fault dictionary format and diagnosis algorithms are presented. Both combinational and sequential circuits are considered. Dictionaries are created, for example ISCAS circuits and simulated errors diagnosed.<>

Keywords

VLSI; automatic testing; combinatorial circuits; failure analysis; fault location; integrated circuit testing; integrated logic circuits; logic testing; sequential circuits; VLSI failures; automated diagnosis; compressed fault dictionary format; diagnosis algorithms; logic IC; sequential circuits; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Etching; Failure analysis; Fault diagnosis; Optical microscopy; Reliability engineering; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers

Conference_Location

Atlantic City, NJ, USA

Type

conf

DOI

10.1109/VTEST.1991.208156

Filename

208156

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3116720