Title :
Design for diagnosable multiple-output digital systems
Author :
Ma, He-De ; Liu, Ying
Author_Institution :
Sch. of Sci. & Technol., Savannah State Coll., Univ. Syst. of Georgia, GA, USA
Abstract :
A design for diagnosable multiple-output digital systems is presented, in which not only error detection is implemented by the minimum number of checkers but also fault isolation is realized by minimal additional hardware instead of traditional software diagnostic procedures such that the computation time and memory space for fault isolation are eliminated. A partition algorithm is utilized for partitioning a digital system specially into subsystems with each subsystem containing only one primary output. With the aid of this partition algorithm, an algorithm for automatic fault isolation is presented. The algorithm is suitable for computer implementation so that faults in large size digital systems can be isolated automatically. The overhead of the additional hardware to isolate faults automatically is less than 2.1%.<>
Keywords :
automatic testing; digital systems; error detection; fault location; logic design; logic testing; automatic fault isolation; checkers; computer implementation; diagnosable system design; error detection; large size digital systems; multiple-output digital systems; partition algorithm; Circuit faults; Costs; Digital systems; Educational institutions; Fault detection; Hardware; Isolation technology; Partitioning algorithms; Testing; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location :
Atlantic City, NJ, USA
DOI :
10.1109/VTEST.1991.208159
