• DocumentCode
    3116959
  • Title

    Comparison between the dynamic behavior of maximum length and cyclic shift registers

  • Author

    Seireg, Reda H. ; Vacroux, André G.

  • Author_Institution
    Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    1991
  • fDate
    15-17 April 1991
  • Firstpage
    260
  • Lastpage
    264
  • Abstract
    The study of the performance of maximum length and cyclic shift registers has been extended to broader classes of circuits. A new general form for the characteristic equation of the transition probability matrix was deduced which differs from equations obtained earlier.<>
  • Keywords
    Markov processes; matrix algebra; probability; shift registers; characteristic equation; cyclic shift registers; dynamic behavior; maximum length registers; transition probability matrix; Circuit faults; Circuit testing; Compaction; Equations; Markov processes; Performance analysis; Polynomials; Printed circuits; Shift registers; Transmission line matrix methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
  • Conference_Location
    Atlantic City, NJ, USA
  • Type

    conf

  • DOI
    10.1109/VTEST.1991.208168
  • Filename
    208168
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3116959