Title :
Line replaceable unit interface testing upset testing using the R2SPG technique and Terminal Protection Device (TPD) testing
Author_Institution :
Electromagn. Effects, Albuquerque, NM
Abstract :
A collection of slides from the authors´ conference presentation is given.
Keywords :
electron device testing; R2SPG technique; interface testing; line replaceable unit; terminal protection device testing; upset testing; Aerospace electronics; Circuit testing; EMP radiation effects; Electromagnetic compatibility; Electromagnetic devices; Electromagnetic measurements; Protection; Pulse circuits; Pulse measurements; System testing;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652211
