Title :
The low frequency noise in reference diodes
Author :
Kautaniuk, A. ; Apanasovich, V. ; Lutkovski, V. ; Kuchinski, P.
Author_Institution :
Dept. of Syst. Anal., Belarusian State Univ., Minsk, Belarus
Abstract :
The low frequency noise in different types of reference diodes in the breakdown regime is investigated. The dependence of the spectral power density of the noise on the reference diode operating mode is discussed.
Keywords :
noise generators; semiconductor device breakdown; semiconductor device noise; semiconductor diodes; diode breakdown regime; fluctuation transitions theory; noise spectral power density; reference diode low frequency noise; reference diode operating mode; semiconductor noise generators; Circuit noise; Electron devices; Fluctuations; Frequency; Low-frequency noise; Noise generators; Physics; Semiconductor device noise; Semiconductor diodes; Working environment noise;
Conference_Titel :
Electron Devices for Microwave and Optoelectronic Applications, 2002. EDMO 2002. The 10th IEEE International Symposium on
Print_ISBN :
0-7803-7530-0
DOI :
10.1109/EDMO.2002.1174966
