DocumentCode :
3117054
Title :
Thermal performance comparison of chip-on-board, flip chip-on-board and standard TQFP package
Author :
Iliev, Simeon K.
Author_Institution :
VTC Inc., Minneapolis, MN, USA
fYear :
1998
fDate :
10-12 Mar 1998
Firstpage :
161
Lastpage :
168
Abstract :
The focus of this paper is on the thermal performance of wire-bonded chip on board (WB-COB) and flip chip on board (FCOB) packages, which were evaluated and compared to that of a standard thin quad flat pack (TQFP). The effect of five different enhancements of WB-COB and FCOB assemblies on their thermal performance was also investigated. Furthermore, the thermal limits (maximum allowable power dissipation under still-air conditions, based on a maximum junction temperature of 125°C) of each assembly were defined. According to the results, the standard 32-TQFP package shows the lowest thermal resistance (θja), compared to the θja of WB-COB and FCOB assemblies. The thermally-enhanced WB-COB assembly, in which the die is directly attached to the Al or Cu stiffener, shows the most significant thermal improvement. Maximum power dissipation (based on a 125°C maximum junction temperature) of the same assembly is raised by a factor of 2.6. The impact of solder bump voids on the thermal performance of FCOB assembly is shown to be insignificant. The underfill `total´ air gap increases θja of a thermally-enhanced FCOB assembly by 16.5%
Keywords :
encapsulation; flip-chip devices; integrated circuit packaging; integrated circuit testing; lead bonding; soldering; thermal analysis; thermal resistance; voids (solid); 125 C; Al; Al stiffener; COB packages; Cu; Cu stiffener; FCOB assemblies; FCOB packages; WB-COB assemblies; WB-COB packages; chip-on-board package; direct die attach; flip chip-on-board package; maximum allowable power dissipation; maximum junction temperature; solder bump voids; standard TQFP package; still-air conditions; thermal limits; thermal performance; thermal resistance; thermally-enhanced FCOB assembly; thermally-enhanced WB-COB assembly; thin quad flat pack; underfill total air gap; wire-bonded chip on board packages; Assembly; Copper; Disk drives; Electronics packaging; Flip chip; Power dissipation; Temperature; Thermal factors; Thermal resistance; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1998. SEMI-THERM Proceedings 1998., Fourteenth Annual IEEE
Conference_Location :
San Diego, CA
ISSN :
1065-2221
Print_ISBN :
0-7803-4486-3
Type :
conf
DOI :
10.1109/STHERM.1998.660402
Filename :
660402
Link To Document :
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