Title :
Digest of Papers. 1991 VLSI Test Symposium. Chip-to-System Test Concerns for the 90´s (Cat. No.91TH0353-3)
Abstract :
Presents the cover from the proceedings of this conference.
Keywords :
VLSI; application specific integrated circuits; automatic test equipment; built-in self test; fault location; integrated circuit testing; production testing; ASIC reliability; ATE architecture; BIST; DFT; boundary scan; built-in self-test; current testing; delay testing; design for testability; fault diagnosis; fault grading; fault modeling; production testing; test generation; testability;
Conference_Titel :
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Conference_Location :
Atlantic City, NJ, USA
DOI :
10.1109/VTEST.1991.208176
