DocumentCode :
3117169
Title :
IEC transient-immunity testing overview
Author :
Braxton, T.E.
Author_Institution :
Shure Inc., Niles, IL
fYear :
2008
fDate :
18-22 Aug. 2008
Firstpage :
1
Lastpage :
6
Abstract :
First things first: define what constitutes a failure in your product and make that part of the test plan. Check product category to see if additional immunity tests are required. Monitor all responses as tests are executed.
Keywords :
IEC standards; electrostatic discharge; immunity testing; lightning; power system transients; surges; IEC transient-immunity testing; discharge methods; electrical fast transient burst; electrostatic discharge; lightning surges; magnetic field tests; shielded data line; surge test; switching surge; telecom application; Conferences; Contacts; Electromagnetic compatibility; Electrostatic discharge; IEC standards; Immunity testing; Lightning; Performance evaluation; Surges; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
Type :
conf
DOI :
10.1109/ISEMC.2008.4652218
Filename :
4652218
Link To Document :
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