Title :
Introduction to VCCI kit module EMI program An approach for module level EMI quantification
Author :
Sakurai, Akihisa ; Yamane, Hiroshi ; Nagasawa, Haruyoshi ; Yamada, Kojiro
Author_Institution :
IBM, Armonk, NY
Abstract :
A collection of slides from the authors´ conference presentation is given.
Keywords :
electromagnetic interference; modules; EMI program; EMI quantification; VCCI kit module; module level; Circuit testing; Electromagnetic compatibility; Electromagnetic interference; Electromagnetic measurements; IEC standards; Integrated circuit measurements; Integrated circuit testing; Magnetic resonance; Magnetic semiconductors; Probes;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652221
