DocumentCode :
3117271
Title :
Coulomb interactions between dust particles in plasma etching reactors
Author :
Hwang, H.H. ; Kushner, M.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
fYear :
1996
fDate :
3-5 June 1996
Firstpage :
281
Abstract :
Summary form only given. We discuss results from a computer model for dust particle transport in reactive ion etching discharges where particle-particle Coulomb interactions are included. The basis of this study is a previously described dust transport simulation (DTS) which calculates particle trajectories by integrating the equations of motion due to the sum of the appropriate forces. Debye shielded Coulomb interactions between dust particles have been added to the DTS on a particle-by-particle basis. Results from the DTS indicate that particle-particle interactions modify trapping locations from localized points to extended sheets. Clouds or domes of particles typically observed above wafers are largely a consequence of particle-particle interactions which redistribute particles on nearly equipotential surfaces.
Keywords :
sputter etching; Debye shielded Coulomb interactions; computer model; dust particle transport; dust transport simulation; equipotential surfaces; particle trajectories; particle-particle Coulomb interactions; plasma etching reactors; reactive ion etching discharges; Dusty plasma; Etching; Inductors; Optical fiber sensors; Plasma applications; Plasma density; Plasma displays; Plasma materials processing; Plasma temperature; Plasma transport processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
Conference_Location :
Boston, MA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3322-5
Type :
conf
DOI :
10.1109/PLASMA.1996.551626
Filename :
551626
Link To Document :
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