DocumentCode :
3117414
Title :
FIT numerical modeling for EMI Discovery and #x201C;Design#x201D;
Author :
Drewniak, J.
Author_Institution :
UMR/MS&T EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO
fYear :
2008
fDate :
18-22 Aug. 2008
Firstpage :
1
Lastpage :
11
Abstract :
A collection of slides from the authors´ conference presentation is given.
Keywords :
SPICE; electromagnetic interference; EMI; FIT; SPICE; numerical modeling; Electromagnetic compatibility; Electromagnetic interference; Laboratories; Numerical models; Physics; Predictive models; SPICE; Solid modeling; Stripline; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
Type :
conf
DOI :
10.1109/ISEMC.2008.4652229
Filename :
4652229
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3117414
بازگشت