DocumentCode :
3117601
Title :
Thermal performance analysis of photoelectric parameters on high-power LEDs packaging modules
Author :
Liu, Lei ; Yang, Daoguo ; Zhang, G.Q. ; You, Zhi ; Hou, Fengze ; Liu, Dongjing
Author_Institution :
Guilin Univ. of Electron. Technol., Guilin, China
fYear :
2011
fDate :
18-20 April 2011
Firstpage :
42374
Lastpage :
42495
Abstract :
Compared with incandescent lamps and fluorescent lamps, nowadays LEDs (Light Emitting Diodes) are power saving, environment-friendly, and have the advantages of long lifetime and flexible color output. Therefore, LEDs are being widely used in many fields. In this paper, three high-power LEDs packaging modules with different packaging structures were selected to do the performance analysis based on the experiments. In the measurement, the LED junction temperature was controlled at seven levels (25°C, 50°C, 65°C, 75°C, 85°C, 95C, 100°C) in sequence. The thermal variation of some photoelectric parameters for LED packaging modules, such as forward voltage, relative flux output, correlated color temperature (CCT), color rending index (Ra), luminous efficiency and spectrum, were focused on and analyzed here. The experimental results demonstrated that the luminous flux, luminous efficacy and forward voltage of LEDs decreased with the increase of the junction temperature, but these three LEDs packaging modules have different varieties on CRI, CCT and spectrum. The related reasons were analyzed briefly in this paper.
Keywords :
electronics packaging; light emitting diodes; color rending index; correlated color temperature; fluorescent lamps; forward voltage; high-power LED packaging modules; incandescent lamps; junction temperature; light emitting diodes; luminous efficacy; luminous efficiency; luminous flux; packaging structures; photoelectric parameters; relative flux output; temperature 100 degC; temperature 25 degC; temperature 50 degC; temperature 65 degC; temperature 75 degC; temperature 85 degC; temperature 95 degC; thermal performance analysis; Heating; Junctions; Light emitting diodes; Lighting; Packaging; Reliability; Thermal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on
Conference_Location :
Linz
Print_ISBN :
978-1-4577-0107-8
Type :
conf
DOI :
10.1109/ESIME.2011.5765842
Filename :
5765842
Link To Document :
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