Title :
Scanning nonlinear dielectric microscope for investigation of polarization distributions
Author :
Cho, Yasuo ; Kirihara, Akio
Author_Institution :
Dept. of Electr. Eng., Yamaguchi Univ., Ube, Japan
Abstract :
This paper describes a new scanning technique for imaging the state of spontaneous polarization of a ferroelectric material by measuring the microscopic point-to point variation of its nonlinear dielectric constants
Keywords :
dielectric polarisation; ferroelectric materials; microscopy; permittivity measurement; ferroelectric material; nonlinear dielectric constant; scanning nonlinear dielectric microscope; spontaneous polarization distribution; Capacitance; Dielectric constant; Dielectric measurements; Dielectric thin films; Electric variables measurement; Ferroelectric materials; Frequency; Optical resonators; Polarization; Scanning electron microscopy;
Conference_Titel :
Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
Conference_Location :
East Brunswick, NJ
Print_ISBN :
0-7803-3355-1
DOI :
10.1109/ISAF.1996.602766
