DocumentCode
3117672
Title
Impact of thermal ageing on cohesive and adhesive strengths of overmould materials: Characterisation methods and implementation in FEM
Author
Ivankovic, A. ; Vanstreels, K. ; Hsu, YY ; Gonzalez, M. ; Brizar, G. ; Vanderstraeten, D. ; Blansaer, E. ; Gillon, R. ; Defloor, Martijn ; Vandaele, K. ; Degryse, D. ; Vandevelde, B.
Author_Institution
Imec, Leuven, Belgium
fYear
2011
fDate
18-20 April 2011
Firstpage
42374
Lastpage
42495
Abstract
This paper reports the impact of ageing on the cohesive and adhesive strength of overmould materials used in electronic packages. For so-called harsh environment applications, the overmoulded package operates in an ambient at a continuous temperature of 175°C, or sometimes even 200°C. At these high temperatures, it can be expected that the overmould material and its interfaces degrade. In order to select the right overmould materials, ageing tests have been performed on different commercially available materials. Static bending experiments are used to measure the elastic modulus, the ultimate strength and the interface strength. The impact of the materials properties changed by thermal ageing, are implemented in Finite Element Models. For a particular package, the study shows after how many hours of ageing, the stresses can lead to overmould cracking.
Keywords
adhesives; ageing; bending strength; elastic moduli; electronics packaging; finite element analysis; materials testing; thermal analysis; FEM; adhesive strengths; cohesive strengths; elastic modulus; electronic packages; finite element models; interface strength; overmould cracking; overmould materials; static bending experiments; temperature 175 degC; temperature 200 degC; thermal ageing test; ultimate strength; Aging; Curing; Data models; Irrigation; Joints; Lead; Materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2011 12th International Conference on
Conference_Location
Linz
Print_ISBN
978-1-4577-0107-8
Type
conf
DOI
10.1109/ESIME.2011.5765846
Filename
5765846
Link To Document