Title :
Jitter: Basics, relevance and measurement methods
Author :
Pommerenke, David
Abstract :
A collection of slides from the authors´ conference presentation is given.
Keywords :
circuit noise; jitter; time-varying networks; bit error rate; eye diagram; jitter; measurement methods; time domain; Bit error rate; Clocks; Distortion measurement; Frequency measurement; Jitter; Phase noise; Sampling methods; Signal analysis; Time measurement; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2008. EMC 2008. IEEE International Symposium on
Conference_Location :
Detroit, MI
Print_ISBN :
978-1-4244-1699-8
Electronic_ISBN :
978-1-4244-1698-1
DOI :
10.1109/ISEMC.2008.4652242
