Title :
Dielectric constant of PVDF/MgO nanocomposites thin films
Author :
Rozana, M.D. ; Arshad, A.N. ; Wahid, M.H. ; Habibah, Z. ; Ismail, L.N. ; Sarip, M.N. ; Rusop, M.
Author_Institution :
Fac. of Appl. Sci., Univ. Teknol. MARA (UiTM), Shah Alam, Malaysia
Abstract :
This study investigates the effect of varying loading percentage of MgO on the dielectric constant of Poly (vinylideneflouride)/Magnesium Oxide (PVDF/MgO) nanocomposite thin films. PVDF/MgO nanocomposite spin coated thin films were successfully fabricated and characterized. PVDF and nanocomposites solutions with loading percentage of MgO at 3, 5, 7, 9, and 11% were spin coated on Al-glass substrates at 1500rpm. The optimum percentage of PVDF/MgO thin film obtained from the dielectric measurement was 7%. The dielectric constant of PVDF/Mg(7%) nanocomposite at frequency 103 Hz was 21, with low dielectric loss and absence of visible film defects, as evident by FE-SEM images. In FTIR, broad bonding peaks at 840 and 880 cm-1 can be observed. Both bonding represented the -CH2 and -CF2 groups of PVDF, which indicated high β-phase content that attributed to the increment in the dielectric constant of PVDF/MgO(7%) nanocomposite. The PVDF/MgO(7%) nanocomposite is favorable for low frequency electronic application such as capacitor.
Keywords :
Fourier transform spectra; dielectric losses; dielectric thin films; infrared spectra; magnesium compounds; nanocomposites; permittivity; permittivity measurement; polymers; scanning electron microscopy; spin coating; Al-glass substrates; FE-SEM images; FTIR; MgO; PVDF/MgO nanocomposites spin coated thin films; Poly (vinylideneflouride)/Magnesium Oxide; broad bonding peaks; capacitor; dielectric constant; dielectric measurement; high β-phase content; low dielectric loss; low frequency electronic application; varying loading percentage; visible film defects; Dielectric constant; Dielectric losses; Films; Loading; Nanocomposites; Polymers; FESEM; FTIR; MgO; PVDF; dielectric constant; nanocomposite;
Conference_Titel :
Business, Engineering and Industrial Applications (ISBEIA), 2012 IEEE Symposium on
Conference_Location :
Bandung
Print_ISBN :
978-1-4577-1632-4
DOI :
10.1109/ISBEIA.2012.6422866