DocumentCode
3117868
Title
New technology and tool for enhanced packaging of semiconductor power devices
Author
Solomala, Pierre ; Castellazzi, Alberto ; Mermet-Guyennet, M. ; Johnson, Mark
Author_Institution
Power Electron. Assoc. Res. Lab., ALSTOM Transp., Semeac, France
fYear
2009
fDate
5-8 July 2009
Firstpage
2020
Lastpage
2025
Abstract
This paper presents a novel interconnect technology and packaging solution for silicon power devices, along with the virtual prototyping tool created to develop the concept and optimize it in terms of reliability. The technology is based on the use of bumps (i.e., conductive spheres or cylinders) to connect the surface of vertical power components and is characterized, in comparison with standard bond-wire technology, by reduced stray inductance (i.e., better performance), higher integration levels (i.e., higher power density) and double-sided chip cooling capability (i.e., improved efficiency), key aspects in power electronics technology evolution. The tool exemplifies an innovative methodology for using multi-domain multi-level abstraction simulation as the principal instrument of iterative design and optimization, enabler for competitive development of novel power technologies.
Keywords
integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; iterative methods; lead bonding; optimisation; packaging; power semiconductor devices; silicon; Si; bumps; conductive spheres; cylinders; double-sided chip cooling capability; higher integration levels; interconnect technology; iterative design; multidomain multilevel abstraction simulation; optimization; packaging; power density; power electronics technology; reduced stray inductance; reliability; semiconductor power devices; silicon power devices; standard bond-wire technology; vertical power component surface; virtual prototyping tool; Bonding; Design optimization; Electronics cooling; Inductance; Instruments; Iterative methods; Power electronics; Semiconductor device packaging; Silicon; Virtual prototyping;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics, 2009. ISIE 2009. IEEE International Symposium on
Conference_Location
Seoul
Print_ISBN
978-1-4244-4347-5
Electronic_ISBN
978-1-4244-4349-9
Type
conf
DOI
10.1109/ISIE.2009.5215915
Filename
5215915
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