Title :
Embedded high-precision frequency-based capacitor measurement system
Author :
Welter, Loic ; Dreux, Philippe ; Portal, J.-M. ; Aziza, H.
Author_Institution :
STMicroelectron. Rousset, Rousset, France
Abstract :
This paper presents a direct way to measure the electrical value of capacitors embedded in a circuit using a ring-oscillator. A calibration system ensures robustness towards temperature, power supply and process variations. The measurement is largely automated to minimize the use of external instrumentation and to speed-up the measurement process while giving a digital signature of the capacitor value. Design-Of-Experiment (DOE) methodology has been conducted in order to validate the ability of the system to measure robustly a large range of small capacitors.
Keywords :
calibration; capacitance measurement; capacitors; computerised instrumentation; design of experiments; embedded systems; measurement systems; oscillators; DOE methodology; automated measurement; calibration system; capacitor value; design of experiment methodology; digital signature; electrical value measurement; embedded high-precision frequency-based capacitor measurement system; measurement process variations; power supply variation; ring-oscillator; Decision support systems; Testing; embedded capacitor measurement; process variations; ring oscillator;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International
Conference_Location :
Chania
DOI :
10.1109/IOLTS.2013.6604061