Title :
High temperature retention properties of ferroelectric PZT/YBCO heterostructures investigated by pyroelectric current and phase detection
Author :
Wu, N.J. ; Lin, H. ; Zomorrodian, A.R. ; Liu, D. ; Ignatiev, A.
Author_Institution :
Texas Center for Supercond., Houston Univ., TX, USA
Abstract :
Epitaxial PZT thin films with preferential polarization orientation have been deposited on oxide YBCO thin films. The retention properties have been examined for the memory cells made of PZT/YBCO heterostructure. A novel pyroelectric current and phase detection method (PCPD) has been developed for ferroelectric polarization retention investigation. A polarization degradation of less than 5% was detected for PZT at temperatures as high as 200°C when examined by the PCPD method and by the conventional double pulse method
Keywords :
barium compounds; ferroelectric storage; ferroelectric thin films; high-temperature techniques; lead compounds; piezoceramics; pyroelectricity; yttrium compounds; 200 C; PZT-YBaCuO; PbZrO3TiO3-YBaCuO; YBCO thin film; double pulse method; epitaxial PZT thin film; ferroelectric heterostructure; high temperature retention; memory cell; preferential polarization orientation; pyroelectric current and phase detection; Capacitors; Electrodes; Ferroelectric materials; Phase detection; Polarization; Pulse measurements; Pyroelectricity; Temperature sensors; Transistors; Yttrium barium copper oxide;
Conference_Titel :
Applications of Ferroelectrics, 1996. ISAF '96., Proceedings of the Tenth IEEE International Symposium on
Conference_Location :
East Brunswick, NJ
Print_ISBN :
0-7803-3355-1
DOI :
10.1109/ISAF.1996.602800
