DocumentCode
3118025
Title
Parity check for m-of-n delay insensitive codes
Author
Pontes, Juan ; Calazans, Ney ; Vivet, Pascal
Author_Institution
Fac. of Inf.-FACIN, PUCRS, Porto Alegre, Brazil
fYear
2013
fDate
8-10 July 2013
Firstpage
157
Lastpage
162
Abstract
The advance in deep submicron technologies brings new constraints to circuit design such as variability and sensitivity to soft errors. Asynchronous networks on chip can help coping with some of these constraints due to the timing robustness of design paradigms such as the quasi delay insensitive one. A relevant problem of current fully asynchronous networks on chip is the lack of mechanisms to provide error detection and correction in asynchronous data communication. This work proposes a parity scheme applicable to m-of-n delay insensitive codes, which is capable to correct errors caused by single event effects in delay insensitive communication architectures. The proposed mechanism was evaluated in a 65nm technology where it is able to correct 98% of the errors caused by single event effects with a low overhead in terms of area, power and performance.
Keywords
data communication; delay circuits; error correction codes; error detection codes; integrated circuit design; network-on-chip; parity check codes; power aware computing; sensitivity analysis; timing; asynchronous data communication; circuit design; deep submicron technologies; delay insensitive communication architectures; design paradigms; error correction; error detection; fully asynchronous networks on chip; m-of-n delay insensitive codes; parity check; size 65 nm; timing robustness; Decision support systems; Testing; GALS; delay insensitive codes; error correction; network on chip; single event effects; soft error;
fLanguage
English
Publisher
ieee
Conference_Titel
On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International
Conference_Location
Chania
Type
conf
DOI
10.1109/IOLTS.2013.6604068
Filename
6604068
Link To Document