Title :
Parity check for m-of-n delay insensitive codes
Author :
Pontes, Juan ; Calazans, Ney ; Vivet, Pascal
Author_Institution :
Fac. of Inf.-FACIN, PUCRS, Porto Alegre, Brazil
Abstract :
The advance in deep submicron technologies brings new constraints to circuit design such as variability and sensitivity to soft errors. Asynchronous networks on chip can help coping with some of these constraints due to the timing robustness of design paradigms such as the quasi delay insensitive one. A relevant problem of current fully asynchronous networks on chip is the lack of mechanisms to provide error detection and correction in asynchronous data communication. This work proposes a parity scheme applicable to m-of-n delay insensitive codes, which is capable to correct errors caused by single event effects in delay insensitive communication architectures. The proposed mechanism was evaluated in a 65nm technology where it is able to correct 98% of the errors caused by single event effects with a low overhead in terms of area, power and performance.
Keywords :
data communication; delay circuits; error correction codes; error detection codes; integrated circuit design; network-on-chip; parity check codes; power aware computing; sensitivity analysis; timing; asynchronous data communication; circuit design; deep submicron technologies; delay insensitive communication architectures; design paradigms; error correction; error detection; fully asynchronous networks on chip; m-of-n delay insensitive codes; parity check; size 65 nm; timing robustness; Decision support systems; Testing; GALS; delay insensitive codes; error correction; network on chip; single event effects; soft error;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International
Conference_Location :
Chania
DOI :
10.1109/IOLTS.2013.6604068