Title :
A low-cost input vector monitoring concurrent BIST scheme
Author :
Voyiatzis, Ioannis ; Efstathiou, C. ; Sgouropoulou, C.
Author_Institution :
Technol. Educ. Inst. of Athens, Athens, Greece
Abstract :
Input vector monitoring concurrent BIST schemes perform testing concurrently with the operation of the circuit. In this work a novel input vector monitoring concurrent BIST scheme is presented that compares favorably to previously proposed schemes with respect to the required hardware overhead.
Keywords :
built-in self test; concurrency control; built-in self test scheme; hardware overhead; low-cost input vector monitoring concurrent GIST Scheme; Testing;
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International
Conference_Location :
Chania
DOI :
10.1109/IOLTS.2013.6604074
