• DocumentCode
    3118142
  • Title

    A low-cost input vector monitoring concurrent BIST scheme

  • Author

    Voyiatzis, Ioannis ; Efstathiou, C. ; Sgouropoulou, C.

  • Author_Institution
    Technol. Educ. Inst. of Athens, Athens, Greece
  • fYear
    2013
  • fDate
    8-10 July 2013
  • Firstpage
    179
  • Lastpage
    180
  • Abstract
    Input vector monitoring concurrent BIST schemes perform testing concurrently with the operation of the circuit. In this work a novel input vector monitoring concurrent BIST scheme is presented that compares favorably to previously proposed schemes with respect to the required hardware overhead.
  • Keywords
    built-in self test; concurrency control; built-in self test scheme; hardware overhead; low-cost input vector monitoring concurrent GIST Scheme; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International
  • Conference_Location
    Chania
  • Type

    conf

  • DOI
    10.1109/IOLTS.2013.6604074
  • Filename
    6604074
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3118142