Title :
7ns 4Mb BICMOS SRAM With Parallel Testing Circuit
Author :
Okajima, Y. ; Sato, Y. ; Kurosaki, K. ; Yamada, S.
Author_Institution :
Fujitsu Limited
Keywords :
BiCMOS integrated circuits; CMOS process; Circuit testing; Decoding; Electrodes; MOSFETs; Random access memory; Read-write memory; Switches; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 1991. Digest of Technical Papers. 38th ISSCC., 1991 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-644-6
DOI :
10.1109/ISSCC.1991.689061
