Title :
Analysis of unbounded and bounded circuits and antennas considering finite extent and inhomogeneous dielectric
Author :
Xiaohong Jiang ; Ke Wu
Author_Institution :
Dept. of Electr. Eng., Ecole Polytech. de Montreal, Que., Canada
Abstract :
A field-theoretical algorithm is presented for characterizing unbounded and bounded circuits and antennas. Finite extent and inhomogeneous dielectric layer are rigorously considered in this method of lines-based model. The unbounded effects are determined with an improved lossy absorbing boundary condition (LABC) which can handle both propagating and evanescent waves. This analysis accounts for all the physical effects including electromagnetic coupling, evanescent higher-order modes, space-wave radiation and surface-wave leakage losses. Examples are given for unbounded loss effects including microstrip open-end deposited on a finite dielectric substrate and gap discontinuities on an inhomogeneous layer. Results indicate that the unbounded loss may be controlled by certain finite extent of the dielectric layer.
Keywords :
S-parameters; antenna theory; losses; matrix algebra; microstrip antennas; microstrip circuits; microstrip discontinuities; microwave integrated circuits; millimetre wave integrated circuits; antennas; bounded circuits; electromagnetic coupling; evanescent higher-order modes; evanescent waves; field-theoretical algorithm; finite dielectric substrate; finite extent; gap discontinuities; inhomogeneous dielectric; inhomogeneous layer; lossy absorbing boundary condition; method of lines-based model; microstrip open-end; physical effects; propagating waves; space-wave radiation; surface-wave leakage losses; unbounded circuits; Antennas and propagation; Boundary conditions; Circuits; Dielectric losses; Dielectric substrates; Electromagnetic analysis; Electromagnetic coupling; Electromagnetic propagation; Electromagnetic propagation in absorbing media; Propagation losses;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.602868