• DocumentCode
    3118384
  • Title

    Nonlinear Characterization of Electrostatic MEMS Resonators

  • Author

    Agarwal, Manu ; Park, Kwan Kyu ; Candler, Rob N. ; Kim, Bongsang ; Hopcroft, Matthew A. ; Chandorkar, Saurabh A. ; Jha, Chandra M. ; Melamud, Renata ; Kenny, Thomas W. ; Murmann, Boris

  • Author_Institution
    Dept. of Electr. & Mech. Eng., Stanford Univ., CA
  • fYear
    2006
  • fDate
    38869
  • Firstpage
    209
  • Lastpage
    212
  • Abstract
    Encapsulated micromechanical resonator technology is becoming important as a potential replacement for quartz for several applications. In this work we report the nonlinear characterization, particularly the A-f effect, in these resonators. The A-f effect in quartz has been well studied in the 1970´s and 1980´s (Gagnepain, 1981) and (Gagnepain, 1987), as it dictates the maximum power (current) that can be handled by the resonator. MEMS resonators tend to have a strong A-f effect compared to quartz, and this is the reason for the low power handling in these devices in comparison to quartz crystal resonators. In this work we report the mechanism of nonlinearities in these devices and find design guidelines to improve performance
  • Keywords
    electrostatic devices; micromechanical resonators; A-f effect; electrostatic MEMS resonators; encapsulated micromechanical resonator technology; nonlinear characterization; power handling; quartz crystal resonators; Electrostatics; Etching; Fluctuations; Frequency; Low-frequency noise; Micromechanical devices; Oscillators; Stability; USA Councils; Vibrations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    International Frequency Control Symposium and Exposition, 2006 IEEE
  • Conference_Location
    Miami, FL
  • Print_ISBN
    1-4244-0074-0
  • Electronic_ISBN
    1-4244-0074-0
  • Type

    conf

  • DOI
    10.1109/FREQ.2006.275380
  • Filename
    4053758