DocumentCode
3118384
Title
Nonlinear Characterization of Electrostatic MEMS Resonators
Author
Agarwal, Manu ; Park, Kwan Kyu ; Candler, Rob N. ; Kim, Bongsang ; Hopcroft, Matthew A. ; Chandorkar, Saurabh A. ; Jha, Chandra M. ; Melamud, Renata ; Kenny, Thomas W. ; Murmann, Boris
Author_Institution
Dept. of Electr. & Mech. Eng., Stanford Univ., CA
fYear
2006
fDate
38869
Firstpage
209
Lastpage
212
Abstract
Encapsulated micromechanical resonator technology is becoming important as a potential replacement for quartz for several applications. In this work we report the nonlinear characterization, particularly the A-f effect, in these resonators. The A-f effect in quartz has been well studied in the 1970´s and 1980´s (Gagnepain, 1981) and (Gagnepain, 1987), as it dictates the maximum power (current) that can be handled by the resonator. MEMS resonators tend to have a strong A-f effect compared to quartz, and this is the reason for the low power handling in these devices in comparison to quartz crystal resonators. In this work we report the mechanism of nonlinearities in these devices and find design guidelines to improve performance
Keywords
electrostatic devices; micromechanical resonators; A-f effect; electrostatic MEMS resonators; encapsulated micromechanical resonator technology; nonlinear characterization; power handling; quartz crystal resonators; Electrostatics; Etching; Fluctuations; Frequency; Low-frequency noise; Micromechanical devices; Oscillators; Stability; USA Councils; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
International Frequency Control Symposium and Exposition, 2006 IEEE
Conference_Location
Miami, FL
Print_ISBN
1-4244-0074-0
Electronic_ISBN
1-4244-0074-0
Type
conf
DOI
10.1109/FREQ.2006.275380
Filename
4053758
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