DocumentCode :
311854
Title :
Characteristics of trenched coplanar waveguide for SiMMIC applications
Author :
Bu, Z.R. ; Fusco, Vincent F. ; Stewart, J.A.C. ; Wu, Y. ; Gamble, H.S. ; Armstrong, B.M. ; Buchanan, N.B.
Author_Institution :
Dept. of Electr. & Electron. Eng., Queen´s Univ., Belfast, UK
Volume :
2
fYear :
1997
fDate :
8-13 June 1997
Firstpage :
735
Abstract :
A novel low loss trenched aluminium CPW transmission line structure, fabricated on a selection of high, medium and low resistivity silicon substrate materials, is reported. In comparison with conventional aluminium conductor CPW line structures, RF losses are reduced. For 10 K/spl Omega/ cm high resistivity material, this reduction may be as much as 0.5 dB/cm at 30 GHz, achieved by etching longitudinal trenches in the silicon substrate material. For medium resistivity substrates (700-1000 /spl Omega/ cm,) a 13 /spl mu/m deep trench reduces measured line loss from 3.9 dB/cm to 3.4 dB/cm at 30 GHz. For low resistivity silicon substrate material (10-20 /spl Omega/ cm), RF losses can be improved by 36 dB/cm at 30 GHz with 80 /spl mu/m deep trenches. The effect of the trench depth on the characteristic impedance of these CPW lines is reported.
Keywords :
MMIC; aluminium; coplanar waveguides; elemental semiconductors; integrated circuit metallisation; silicon; 30 GHz; Al; CPW transmission line; RF loss; Si; Si MMIC; aluminium conductor; characteristic impedance; etching; silicon substrate resistivity; trenched coplanar waveguide; Aluminum; Conducting materials; Conductivity; Coplanar transmission lines; Coplanar waveguides; Etching; Loss measurement; Propagation losses; Radio frequency; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-3814-6
Type :
conf
DOI :
10.1109/MWSYM.1997.602895
Filename :
602895
Link To Document :
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